Hard-Disk
我的硬碟是否有壞扇區？
我有一個新驅動器，我很困惑是否
smartctl檢測到壞扇區。短自檢和擴展自檢completed without error。但Error Log表示Uncorrectable error in data為96 sectors.這是
smartctl輸出：smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-52-generic] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Model Family: Hitachi Deskstar T7K500 Device Model: Hitachi HDT725025VLA380 Serial Number: VFL104R73X993Z LU WWN Device Id: 5 000cca 316f723ca Firmware Version: V5DOA73A User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Wed Feb 5 19:19:29 2014 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4949) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 83) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 110 110 024 Pre-fail Always - 338 (Average 340) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1838 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 11746 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1822 192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 2103 193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 2103 194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 12/48) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 27 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 27 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 03 80 c4 33 e7 40 00 02:28:22.700 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT ef 03 46 c4 33 e7 00 00 02:28:22.200 SET FEATURES [Set transfer mode] Error 26 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 03 80 c4 33 e7 40 00 02:28:11.700 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT ef 03 46 c4 33 e7 00 00 02:28:11.200 SET FEATURES [Set transfer mode] Error 25 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 03 80 c4 33 e7 40 00 02:28:00.700 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT ef 03 46 c4 33 e7 00 00 02:28:00.200 SET FEATURES [Set transfer mode] Error 24 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 03 80 c4 33 e7 40 00 02:27:49.700 READ DMA EXT 25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT 25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT ef 03 46 c4 33 e7 00 00 02:27:49.200 SET FEATURES [Set transfer mode] Error 23 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 03 80 c4 33 e7 40 00 02:27:38.900 READ DMA EXT 25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT 35 03 08 7c a8 3a 40 00 02:27:38.900 WRITE DMA EXT 25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT 25 03 08 a4 eb 94 40 00 02:27:38.900 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 11746 - # 2 Short offline Completed without error 00% 11744 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.這是一個截圖
Error Log：那麼發生了什麼？驅動器是否有壞扇區？
UPDATE1：
只是為了確保我也按照你如何
badblocks使用壞塊中的建議使用了？.一、非破壞性、1h長的只讀方式：
root@xubuntu:/home/xubuntu# badblocks -sv /dev/sda Checking blocks 0 to 244198583 Checking for bad blocks (read-only test): done Pass completed, 0 bad blocks found. (0/0/0 errors)然後是破壞性的、長達 10 小時的寫入方法（小心使用！）：
root@xubuntu:/home/xubuntu# badblocks -wsv /dev/sda Checking for bad blocks in read-write mode From block 0 to 244198583 Testing with pattern 0xaa: done Reading and comparing: done Testing with pattern 0x55: done Reading and comparing: done Testing with pattern 0xff: done Reading and comparing: done Testing with pattern 0x00: done Reading and comparing: done Pass completed, 0 bad blocks found. (0/0/0 errors)正如答案中所建議的那樣，這個硬碟驅動器上看起來確實沒有壞扇區。（耶！）
您的磁碟在從表面讀取數據時出現了一些問題，但似乎磁碟已處理了它。我有類似的情況：
Error 29 occurred at disk power-on lifetime: 18836 hours (784 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 00 40 37 e6 Error: UNC 8 sectors at LBA = 0x06374000 = 104284160 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 00 40 37 e6 08 03:39:32.447 READ DMA c8 00 08 f8 3f 37 e6 08 03:39:32.447 READ DMA c8 00 08 f0 3f 37 e6 08 03:39:32.447 READ DMA c8 00 08 e8 3f 37 e6 08 03:39:32.447 READ DMA c8 00 08 e0 3f 37 e6 08 03:39:32.447 READ DMA當我想進行測試時，我得到了：
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 7 Short offline Completed: read failure 90% 18845 104284160最終，我設法解除了對扇區的阻塞，在執行擴展測試後，掃描整個表面，我得到了以下結果：
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 3 Extended offline Completed without error 00% 18858 -如果有壞塊，可以在下表中觀察到：
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0在您的情況下，沒有跡象表明有壞扇區，因為在最後一個錯誤發生（11706 h）之後執行了擴展測試（11746 h）。這樣，你就可以安然入睡了。:)
正如我在評論中提到的，有兩種類型的壞塊。以下是有關兩者之間區別的簡簡訊息：
有兩種類型的壞扇區——通常分為“物理”和“邏輯”壞扇區或“硬”和“軟”壞扇區。
物理（或硬）壞扇區是硬碟驅動器上物理損壞的儲存集群。硬碟驅動器的磁頭可能接觸了硬碟驅動器的該部分並損壞了它，一些灰塵可能落在該扇區上並損壞了它，固態驅動器的快閃記憶體單元可能已經磨損，或者硬碟驅動器可能有其他導致扇區物理損壞的缺陷或磨損問題。這種類型的扇區無法修復。
邏輯（或軟）壞扇區是硬碟驅動器上似乎無法正常工作的儲存集群。作業系統可能試圖從該扇區讀取硬碟驅動器上的數據，發現糾錯碼 (ECC) 與該扇區的內容不匹配，這表明有問題。這些可能被標記為壞扇區，但可以通過用零覆蓋驅動器來修復 - 或者在過去，執行低級格式化。Windows 的磁碟檢查工具也可以修復此類壞扇區。